Transmission electron microscopy characterization of GaN nanowires
نویسندگان
چکیده
منابع مشابه
Defects, Structure and Properties of Gan Nanowires and Fib-pt/gan Nanowire Contacts: a Transmission Electron Microscopy Study
ACKNOWLEDGEMENTS None of this work would have ever materialized without the involvement of several key persons near the start of my Penn career. I was still a freshman in the spring of 2002 when Prof. John (Jack) Fischer gave me a TEM project on GaAs nanowires and a chance to work alongside the ever-jovial Robert Barsotti. That summer I turned up at the office of Dr. Doug Yates in the Edison bu...
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ژورنال
عنوان ژورنال: Journal of Electronic Materials
سال: 2002
ISSN: 0361-5235,1543-186X
DOI: 10.1007/s11664-002-0089-4